OSRAM has a long time experience in the investigation and analysis of materials. Different analytical equipment is available for material development, material characterization, failure analysis or element determination, like e.g.:

• Carbon-, Sulfur-, Oxygen-, Nitrogen- und CSB-determination
• Wet chemistry analytic - Titration and Photometry
• Element Analytic: ICP OES, AAS, XRF
• Quadrupole Mass Spectrometer
• Elektron Microscope investigation: SEM, EDX, EBSD
• Powder characterization: grain size distribution, mold-ability, flow-ability, residual stress
• Powder X-ray diffraction for structure determination
• Micro sectioning, metallographic and light microscopic investigations
• PIM feedstock characterization by double capillary rheology
• mechanical material testing: tension, bending, compression, micro hardness
• Wire characterization: diameter, split measurement, etc.
• thermal material characterization: thermal diffusivity, thermal expansion, heat capacity
• thermal electronic emission measurements for metallic specimen
• Spectral Photometry